mmpp: Various Similarity and Distance Metrics for Marked Point
Processes
Compute similarities and distances between marked point processes.
Version: |
0.6 |
Published: |
2017-09-29 |
DOI: |
10.32614/CRAN.package.mmpp |
Author: |
Hideitsu Hino, Ken Takano, Yuki Yoshikawa, and Noboru Murata |
Maintainer: |
Hideitsu Hino <hinohide at cs.tsukuba.ac.jp> |
License: |
GPL-2 |
NeedsCompilation: |
no |
Materials: |
NEWS |
CRAN checks: |
mmpp results |
Documentation:
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